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Aehr Test Systems | Worldwide Leader in IC Burn-in and Test Equipment

Worldwide Leader in IC Burn-in and Test Equipment. About Aehr Test Systems. Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of systems for burning-in and testing memory and logic integrated circuits and has an installed base of more than 2,500 systems worldwide. Aehr Test has developed and introduced several innovative… more. Test and/or Burn-in of packaged parts. Logic, Memory and Analog devices. Engineering and Production Applications. FOX-1P Massively Parallel Wafer Test.

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Aehr Test Systems | Worldwide Leader in IC Burn-in and Test Equipment | aehr.com Reviews

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Worldwide Leader in IC Burn-in and Test Equipment. About Aehr Test Systems. Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of systems for burning-in and testing memory and logic integrated circuits and has an installed base of more than 2,500 systems worldwide. Aehr Test has developed and introduced several innovative… more. Test and/or Burn-in of packaged parts. Logic, Memory and Analog devices. Engineering and Production Applications. FOX-1P Massively Parallel Wafer Test.

<META> KEYWORDS

1 history

2 management

3 terms of sales

4 selection matrix

5 packaged test/burn in

6 abts l

7 abts li

8 abts m

9 wafer test/burn in

10 full wafer contactors

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history,management,terms of sales,selection matrix,packaged test/burn in,abts l,abts li,abts m,wafer test/burn in,full wafer contactors,diepak,news/events,investors,senior management,investor relations,press releases,annual reports/proxies,offices,careers

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Aehr Test Systems | Worldwide Leader in IC Burn-in and Test Equipment | aehr.com Reviews

https://aehr.com

Worldwide Leader in IC Burn-in and Test Equipment. About Aehr Test Systems. Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of systems for burning-in and testing memory and logic integrated circuits and has an installed base of more than 2,500 systems worldwide. Aehr Test has developed and introduced several innovative… more. Test and/or Burn-in of packaged parts. Logic, Memory and Analog devices. Engineering and Production Applications. FOX-1P Massively Parallel Wafer Test.

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Annual Reports/Proxies | Aehr Test Systems

http://www.aehr.com/investors/proxy-materials

Worldwide Leader in IC Burn-in and Test Systems. ANNUAL REPORTS AND PROXIES. FY 2015 Annual Report. FY 2014 Annual Report. FY 2013 Annual Report. FY 2012 Annual Report. FY 2011 Annual Report. FY 2010 Annual Report. FY 2009 Annual Report.

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Senior Management | Aehr Test Systems

http://www.aehr.com/investors/senior-management

Worldwide Leader in IC Burn-in and Test Systems. Gayn Erickson, President and Chief Executive Officer. Kenneth B. Spink, VP of Finance and CFO. Mark D. Allison, VP of Worldwide Sales. Carl N. Buck, VP of Marketing. David S. Hendrickson, VP of Engineering. David L. Fucci, VP of Operations. Kunio Sano, President, Aehr Test Systems Japan K.K. Rhea Posedel, Chairman. Robert R. Anderson, Director. William W. R. Elder, Director. Gayn Erickson, President and Chief Executive Officer. Mario M. Rosati, Director.

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News/Events | Aehr Test Systems

http://www.aehr.com/newsevents

Worldwide Leader in IC Burn-in and Test Systems. Product and Company News. July 26, 2016 – Aehr Test Systems Announces $4 Million Order for ABTS Burn-In and Test Systems From Leading IC Manufacturer. July 26, 2016 – Aehr Test Systems Announces Shipment of FOX-1P Next Generation Single Wafer Test System. July 12, 2016 – Aehr Test Systems to Participate in CEO Investor Summit 2016 in San Francisco on July 13. April 4, 2016 – Aehr Test Systems Announces Follow-On Order For FOX-15 WaferPak Contactors. June 3...

4

Selection Matrix | Aehr Test Systems

http://www.aehr.com/products/selection-matrix

Worldwide Leader in IC Burn-in and Test Systems. Advanced Burn-in and Test System for packaged parts. 8212; Logic burn-in. 8212; High power logic – individual temperature control. 8212; Memory burn-in. 8212; High capacity burn-in. 8212; High power device burn-in. High Volume Production Test Solution. Production Proven Full-wafer tester solution. Enables parallel testing 1,000 die in a single touchdown. Reusable, temporary package for bare die. Known Good Die solution. Can be used for burn-in and test.

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Offices | Aehr Test Systems

http://www.aehr.com/offices

Worldwide Leader in IC Burn-in and Test Systems. Fremont, CA. 94539. Phone: 510.623.9400. Fax: 510.623.9450. For a Map to our office, click here. Aehr Test Systems China Rep Office. Phone: 86.181.161.99720. E-Mail: china support@aehr.com. Suite 802, Bldg. 7. 888 Chang Ning Rd. Shanghai, P.R.C. Phone: 86.21.5241.0600. Fax: 86.21.5241.4851. Aehr Test Systems GmbH. D-86919 Utting, Germany. Phone: 49.8806.2021. Fax: 49.8806.2024. Aehr Test Systems Japan. Hashikan Bldg.,1-14. Tokyo, 192-0082, Japan. T: 044&#4...

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Expo | SWTest.org

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To download - right click and "save link as"). SW Test 2016 Keynote by Dr. Friedrich Taenzler. SWTW 05 June - Sunday Tutorial. SWTW 06 June - Monday Podium. SWTW 07 June - Tuesday Podium. SWTW 08 June - Wednesday Podium. Keynote Speaker: Dr. Friedrich Taenzler. Transportation & Weather. The SWTW EXPO is the Who’s Who of industry leaders in the semiconductor wafer test industry. The top probe card, probe equipment and related service suppliers will showcase the latest products and services at SWTW 2016.

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Your browser is no longer supported. Please, upgrade your browser. Select the criteria by which the output information will be sorted. The order settings apply to all views. Use the ascending. Option to invert the current order. TIP: In table views you can click on top of a column to sort the table by the underlying values. EPS growth this year. EPS growth next year. EPS growth past 5 years. EPS growth next 5 years. Sales growth past 5 years. EPS growth qtr over qtr. Sales growth qtr over qtr. Nymox Repo...

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Meidensha Power Quality Solutions. Burn-in and Test system. Battery component: Positive Pole is LiFePO4 (The key material). Negative level is graphite. Country of Origin: Taiwan. Certification: IEC62133, CE, ISO9001. High Current Discharge – 20C current discharge. 5 to 8 times larger than other lithium battery and Lead Acid battery. Long Battery life – More than 2000 cycle life. 3 to7 times larger than other lithium battery and Lead Acid battery. 版權所有 2010 晶順國際股份有限公司 and 翔順科技股份有限公司.

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晶順國際股份有限公司---翔順科技股份有限公司

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Meidensha Power Quality Solutions. Burn-in and Test system. Is best viewed with Chrome, IE, Firefox.

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晶順國際股份有限公司---翔順科技股份有限公司

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IWLPC - International Wafer Level Packaging Conference

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Bridging the Interconnect Gap. October 18 - 20, 2016. San Jose, California, USA. Sponsor or Exhibit Today! View available Sponsorship and Exhibitor Opportunities. Dates: October 18-19, 2016. Location: DoubleTree by Hilton Hotel, San Jose, CA. October 19: 9:30am-3:30 pm. Why Exhibit at IWLPC? A focused international audience. In this highly competitive marketplace. And concepts to the market. With existing customers and generate new leads. View the latest floor plan. Two Free Lunches Per Day. 8' D x 10' W).

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IWLPC - International Wafer Level Packaging Conference

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Bridging the Interconnect Gap. October 18 - 20, 2016. San Jose, California, USA. Exhibition: October 18-19, 2016. DoubleTree by Hilton Hotel, San Jose, CA. October 19: 9:30am-5:30 pm. AI Technology, Inc. Applied Materials, Inc. ASM LASER SEPARATION INTERNATIONAL. Carl Zeiss Microscopy, LLC. Conductive Containers, Inc. Cyber technologies USA, LLC. FlipChip International - Huatian. Grinding and Dicing Services Inc. Hitachi Chemical Co., Ltd. Lintec of America, Inc. Nikon Metrology, Inc. SHENMAO America, Inc.

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Taiwan Semiconductor Manufacturing Company, Ltd. Macronix International Co., LTD. King Yuan Electronics Co., Ltd. Siliconware Precision Industries Co., Ltd. The Advanced Semiconductor Engineering Group. CHUNGHWA PICTURE TUBES, LTD. Formosa Advanced Technologies Co., Ltd. Compal Electronics, Inc. United Test Center INC. Prime View International Co., Ltd. Elpida Memory, Inc. Elpida Memory, Inc. Systems on Silicon Manufacturing Co. Pte. Ltd. Systems on Silicon Manufacturing Co. Pte. Ltd.

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Aehr Test Systems | Worldwide Leader in IC Burn-in and Test Equipment

Worldwide Leader in IC Burn-in and Test Equipment. About Aehr Test Systems. Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of systems for burning-in and testing memory and logic integrated circuits and has an installed base of more than 2,500 systems worldwide. Aehr Test has developed and introduced several innovative… more. Test and/or Burn-in of packaged parts. Logic, Memory and Analog devices. Engineering and Production Applications. FOX-1P Massively Parallel Wafer Test.

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